Test Sockets

These test sockets support surface-mount discrete MOSFET packages, which are widely used in next-generation power semiconductors such as SiC and GaN.
With Kelvin contact design, they provide highly accurate measurement, along with excellent withstand voltage, heat resistance, and high-current performance.
They are ideal for rigorous reliability tests (THB, HTRB) and burn-in tests of SiC/GaN MOSFETs.

We offer sockets compatible with a wide range of packages, including TO-252 (D-PAK), TO-263 (D2-PAK), TO-263-7, TO-Leadless, and more.